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Selected Publications
| 92. |
J. M. Gregoire, P. J. McCluskey, D. Dale, S. Ding, J. Schroers, J. J.
Vlassak, "Combining combinatorial nanocalorimetry and X-ray diffraction
techniques to study the effects of composition and quench rate on
Au–Cu–Si metallic glasses", Scripta Materialia 66, 178-181 (2012).(Download) |
| 91. |
Y. Hu, E. P. Chan, J. J. Vlassak, Z. Suo, “Poroelastic relaxation indentation of thin layers of gels”, Journal of Applied Physics, in press (2011). (Download) |
| 90. |
Y. Motemani, P. J. McCluskey, C. Zhao, M. J. Tan, J. J. Vlassak, “Analysis of Ti-Ni-Hf Shape Memory Alloys by Combinatorial Nanocalorimetry”, Acta Materialia (2011). (Download) |
| 89. |
K. Zhao, W. L. Wang, J. Gregoire, M. Pharr, Z. Suo, J. J. Vlassak, E. Kaxiras, “Lithium-Assisted Plastic Deformation of Silicon Electrodes in Lithium-Ion Batteries: A First-Principles Theoretical Study”, Nano Letters dx.doi.org/10.1021/nl201501s (2011). (Download) |
| 88. |
G. D. Sim, S. Won, C. Y. Jin, I.Park, S. B. Lee, J. J. Vlassak, “Improving the stretchability of as-deposited Ag coatings on poly-ethylene-terephthalate substrates through use of an acrylic primer”, Journal of Applied Physics 109, 073511 (2011). (Download) |
| 87. |
P. J. McCluskey, C. Zhao, O. Kfir, J. J. Vlassak, “Precipitation and Thermal Fatigue in Ni-Ti-Zr Shape Memory Alloy Thin Films by Combinatorial nanoCalorimetry”, Acta Materialia, in press (2011). (Download) |
| 86. |
J. M. Knaup, H. Li, J. J. Vlassak, E. Kaxiras, "Influence of CH2 content and network defects on the elastic properties of organosilicate glasses", Physical Review B 83, 054204 (2011). (Download) |
| 85. |
Y. Hu, X. Chen, G. M. Whitesides, J. J. Vlassak, Z. Suo, "Indentation of polydimethylsiloxane submerged in organic solvents", Journal of Materials Research 26(6), 785-795 (2011). (Download) |
| 84. |
K. Zhao, M. Pharr, S. Cai, J. J. Vlassak, Z. Suo, "Large Plastic Deformation in High-Capacity Lithium-Ion Batteries Caused by Charge and Discharge", Journal of the American Ceramic Society, 1-10 (2011). (Download) |
| 83. |
P. J. McCluskey, J. J. Vlassak, "Glass transition and crystallization of amorphous Ni-Ti-Zr thin films by combinatorial nano-calorimetry", Scripta Materialia 64(073517), 264-267 (2011). (Download) |
| 82. |
K. Zhao, M. Pharr, J. J. Vlassak, Z. Suo, "Inelastic hosts as electrodes for high-capacity lithium-ion batteries", Journal of Applied Physics 109, 016110 (2011). (Download) |
| 81. |
K. Zhao, M. Pharr, J. J. Vlassak, Z. Suo, "Fracture of electrodes in lithium-ion batteries caused by fast charging", Journal of Applied Physics 108, 073517 (2010). (Download) |
| 80. |
H. Li, J. M. Knaup, E. Kaxiras, J. J. Vlassak, "Stiffening of organosilicate glasses by organic cross-linking", Acta Materialia 59, 44-52 (2011). (Download) |
| 79. |
P. J. McCluskey, J. J. Vlassak, "Combinatorial nanocalorimetry", Journal of Materials Research 25(11), 2086-2100 (2010). (Download) |
| 78. |
P. J. McCluskey, J. J. Vlassak, "Nano-thermal transport array: an instrument for combinatorial measurements of heat transfer in nanoscale films", Thin Solid Films (2010), doi: 10.1016/j.tsf2010.05.124 (Download) |
| 77. |
C. F. Karanikas, H. Li, J. J. Vlassak, J. J. Watkins, "Quantitative interfacial energy measurements of adhesion-promoted thin copper films by supercritical fluid deposition on barrier layers", Journal of Engineering Materials and Technology-Transactions of the ASME 132(2), 021014 (2010). (Download) |
| 76. |
H. Li, N. X. Randall, J. J. Vlassak, "New methods of analyzing indentation experiments on very thin films", Journal of Materials Research 25(4), 728-734 (2010). (Download) |
| 75. |
N. Lu, Z. Suo, J. J. Vlassak, "The effect of film thickness on the failure strain of polymer-supported metal films", Acta Materialia 58, 1679-1687 (2010). (Download) |
| 74. |
Y. Hu, X. Zhao, J. J. Vlassak, Z. Suo, "Using indentation to characterize the poroelasticity of gels", Applied Physics Letters 96, 121904 (2010). (Download) |
| 73. |
J.-Y. Sun, N. Lu, J. Yoon, K.-H. Oh, Z. Suo, J. J. Vlassak, "Inorganic islands on a highly stretchable polyimide substrate", J. Mater. Res. 24(11), 3338-3342 (2009). (Download) |
| 72. |
X. Wang, J. J. Vlassak, "The effect of film thickness on the martensitic transformation in equi-atomic NiTi thin films constrained by substrates", submitted (2009). (Download) |
| 71. |
H. Li, T. Y. Tsui, J. J. Vlassak, "Water diffusion and fracture behavior in nanoporous low-k dielectric film stacks", J. Appl. Phys. 106, 033503 (2009). (Download) |
| 70. |
Y. Lin, T. Y. Tsui, J. J. Vlassak, "Adhesion degradation and water diffusion in nanoporous organosilicate glass thin film stacks", J. Electrochem. Soc. 157, G53-G56 (2010). (Download) |
| 69. |
N. Lu, X. Wang, Z. Suo, J. J. Vlassak, "Failure by simultaneous grain growth, strain localization, and interface debonding in metal films on polymer substrates", J. Mater. Res. 24(2), 379-385 (2009). (Download) |
| 68. |
H. Li, J. J. Vlassak, "Determining the elastic modulus and hardness of an ultra-thin film on a substrate using nanoindentation", J. Mater. Res. 24(3), (2009). (Download) |
| 67. |
F. L. Wei, C. L. Gan, T. L. Tan, C. S. Hau-Riege, A. P. Marathe, J. J. Vlassak, C. V. Thompson, "Electromigration-induced extrusion failures in Cu/low-k interconnects", J. Appl. Phys. 104, 023529 (2008). (Download) |
| 66. |
Y. Lin, Y. Xiang, T. Y. Tsui, J. J. Vlassak, "PECVD low-permittivity organosilicate glass coatings: adhesion, fracture and mechanical properties", Acta. Mater. 56(17), 4932-4943 (2008). (Download) |
| 65. |
H. Li, Y. Lin, T. Y.Tsui, J. J. Vlassak, "The effect of porogen loading on the stiffness and fracture energy of brittle organosilicates", J. Mater. Res. 24(1), 107-116 (2009). (Download) |
| 64. |
H.-J. Kim, J.-H. Han, R. Kaiser, K. H. Oh, J. J. Vlassak, "High-throughput analysis of thin-film stresses using arrays of micromachined cantilever beams", Rev. Sci. Instrum. 79(4), 045112 (2008). (Download) |
| 63. |
N. Lu, X. Wang, Z. Suo, J. J. Vlassak, "Metal films on polymer substrates stretched beyond 50%", Appl. Phys. Lett. 91, 221909 (2007). (Download) |
| 62. |
X. Wang, M. Rein, J. J. Vlassak, "Crystallization kinetics of amorphous equiatomic NiTi thin films: effect of film thickness", J. Appl. Phys. 103, 023501 (2008). (Download) |
| 61. |
X. Wang, Y. Bellouard, Z. Y. Xue, J. J. Vlassak, "Thermal modeling of laser-annealing-induced crystallization of amorphous NiTi thin films", Appl. Phys. A 90, 689-694 (2007). (Download) |
| 60. |
H. Li, D. B. Farmer, R. G. Gordon, Y. Lin, J. J. Vlassak, "Vapor Deposition of ruthenium from an amidinate precursor", J. Electrochem. Soc. 154, D642-D647 (2007). (Download) |
| 59. |
M. Zhao, X. Chen, Y. Xiang, J. J. Vlassak, D. Lee, N. Ogasawara, N. Chiba, Y. X. Gan, "Measuring elastoplastic properties of thin films on an elastic substrate using sharp indentation", Acta Mater. 55(18), 6260-6274 (2007). (Download) |
| 58. |
Y. Xiang, J. McKinnell, W.-M. Ang, J. J. Vlassak, "Measuring the fracture toughness of ultra-thin films with application to AlTa coatings", Int. J. Fract. 144(3), 173-179 (2007). (Download) |
| 57. |
J.-H. Kim, J. J. Vlassak, "Perturbation analysis of an undulating free surface in a multi-layered structure", Int. J. Solids Struct. 44, 7924-7937 (2007). (Download) |
| 56. |
X. Wang, Z. Y. Xue, Y. Bellouard, J. J. Vlassak, "Laser annealing of amorphous NiTi shape memory alloy thin films", Shape Memory and Superelastic Technologies (SMST) Proceedings, California (2006). (Download) |
| 55. |
D. Passeri, A. Bettucci, M. Germano, M. Rossi, A. Alippi, A. Fiori, E. Tamburri, S. Orlanducci, M.L. Terranova, J. J. Vlassak, "Local indentation modulus characterization via two contact resonance frequencies atomic force acoustic microscopy", Microelectron. Eng. 84(3), 490-494 (2007). (Download) |
| 54. |
J.-H. Kim and J. J. Vlassak, "T-stress of a bi-material strip under generalized edge loads", Int. J. Fract. (Letters section), 142(3-4), 315-322 (2006). (Download) |
| 53. |
Y. Lin, T. Y. Tsui, J. J. Vlassak, "Water diffusion and fracture in organosilicate glass film stacks", Acta Mater. 55, 2455-2464 (2007). (Download) |
| 52. |
P. J. McCluskey, J. J. Vlassak, "Parallel nano-differential scanning calorimetry: a new device for combinatorial analysis of complex nano-scale material systems", Mater. Res. Soc. Symp. Proc. 924E, Z08-14(2006). (Download) |
| 51. |
Y. Kim, P. Chen, M. J. Aziz, D. Branton, J. J. Vlassak, "Focused ion beam induced deflections of freestanding thin films", J. Appl. Phys. 100, 104322 (2006). (Download) |
| 50. |
Y. Xiang, J. J. Vlassak, "Bauschinger and size effects in thin-film plasticity", Acta Materi. 54, 5449-5460 (2006). (Download) |
| 49. |
L. Nicola, Y. Xiang, J. J. Vlassak, E. Van der Giessen, A. Needleman, "Plastic deformation of freestanding thin films: experiments and modeling", J. Mech. Phys. Solids 54(10), 2089-2110 (2006). (Download) |
| 48. |
Y. Lin, T. Y. Tsui, J. J. Vlassak, "Octamethylcyclotetrasiloxane-based low-permittivity organosilicate coatings: composition, structure and polarizability", J. Electrochem. Soc. 153(7), F144-F152 (2006). (Download) |
| 47. |
T. Y. Tsui, A. J. McKerrow, J. J. Vlassak, "The effect of water diffusion on the adhesion of organosilicate glass film stacks", J. Mech. Phys. Solids 54(5), 887-903 (2006). (Download) |
| 46. |
Z. Suo, J. J. Vlassak, S. Wagner, "Micromechanics of macroelectronics", China Particuology 3(6), 321-328 (2005). (Download) |
| 45. |
T. Y. Tsui, J. J. Vlassak, K. Taylor, A. J. McKerrow, R. Kraft, "Effects of absorption of water and other reactive species on the fracture properties of organosilicate glass thin films", AMC Proceedings, 695-700 (2005). (Download) |
| 44. |
X. Wang, J. J. Vlassak, "Crystallization kinetics of amorphous NiTi shape memory alloy thin films", Scr. Mater. 54, 925-930 (2006). (Download) |
| 43. |
X. Chen, Y. Xiang, J. J. Vlassak, "A novel technique of measuring the mechanical properties of porous materials by nanoindentation: with application to low-k dielectric thin films", J. Mater. Res. 21(3), 715-724 (2006). (Download) |
| 42. |
Y. Xiang, X. Chen, T. Y. Tsui, J.-I. Jang, J. J. Vlassak, "Mechanical properties of porous and fully dense low-k dielectric thin films measured by means of nanoindentation and the plane-strain bulge test technique", J. Mater. Res. 21(2), 386-395 (2006). (Download) |
| 41. |
Y. Xiang, T. Y. Tsui, J. J. Vlassak, "The mechanical properties of freestanding electroplated Cu thin films", J. Mater. Res. 21(6), 1607-1618 (2006). (Download) |
| 40. |
Y. Xiang, T. Li, Z. Suo, J. J. Vlassak, "High ductility of a metal film adherent on a polymer substrate", Appl. Phys. Lett. 87, 161910 (2005). (Download) |
| 39. |
X. Wang, Y. Bellouard, J. J. Vlassak, "Laser annealing of amorphous NiTi shape memory alloy thin films to locally induce shape memory properties", Acta Mater. 53(18), 4955-4961 (2005). (Download) |
| 38. |
T. Y. Tsui, A. J. McKerrow, J. J. Vlassak, "Constraint effects on cohesive failures in low-k dielectric thin films", Mater. Res. Soc. Symp. Proc. 863, 3-10 (2005). (Download) |
| 37. |
T. Y. Tsui, A. J. McKerrow, J. J. Vlassak, "Constraint effects on thin film channel cracking behavior", J. Mater. Res. 20(9), 2266-2273 (2005). (Download) |
|
36. |
Y. Xiang, J. J. Vlassak, "Bauschinger effect in thin metal films", Scr. Mater. 53, 177-182 (2005). (Download) |
| 35. |
Y. Xiang, X. Chen, J. J. Vlassak, "The plane-strain bulge test for thin films", J. Mater. Res. 20(9), 2360-2370 (2005). (Download) |
| 34. |
Z. Li, R. G. Gordon, D. B. Farmer, Y. Lin, J. Vlassak, "Nucleation and adhesion of ALD copper on cobalt adhesion layers and tungsten nitride diffusion barriers", Electrochem. Solid-State Lett. 8(7), G182-G185 (2005). (Download) |
| 33. |
Y. Sugimura, I. Cohen-Karni, P. Mccluskey, J. J. Vlassak, "Stress evolution in sputter-deposited Fe-Pd shape-memory thin films", J. Mater. Res. 20 (9), 2279-2287 (2005). (Download) |
|
32. |
Y.-S. Jun, T. A. Kendall, S. T. Martin, C. M. Friend, J. J. Vlassak, "Heteroepitaxial nucleation and oriented growth of manganese oxide islands on carbonate minerals under aqueous conditions", Environ. Sci. Technol. 39(5) 1239-1249 (2005). (Download) |
| 31. |
J. J. Vlassak, Y. Lin, T. Y. Tsui, "Fracture of organosilicate glass thin films: environmental effects", Mater. Sci. Eng. A 391, 159-174 (2005). (Download) |
| 30. |
F. Khelfaoui, Y. Bellouard, T. Gessmann, X. Wang, J. J. Vlassak, M. Hafez, "An investigation of the oxidation of laser and furnace-annealed sputter-deposited Ni-Ti thin films using reflectivity measurements", SMST 2004, Baden-Baden, Germany (2004). (Download) |
| 29. |
Y. Sugimura, T. Cohen-Karni, P. McCluskey, J. J. Vlassak, "Fabrication and characterization of Fe-Pd ferromagnetic shape-memory thin films", Mater. Res. Soc. Symp. Proc. 785, D7.4.1 (2004). (Download) |
| 28. |
Y. Xiang, T. Y. Tsui, J. J. Vlassak, A. J. McKerrow, "Measuring the elastic modulus and ultimate strength of low-k dielectric materials by means of the bulge test", Proceeding of the International Interconnect Technology Conference (IITC) IEEE, 133-135 (2004). (Download) |
| 27. |
Y. Lin, J. J. Vlassak, T. Y. Tsui, A. J. McKerrow, "Subcritical delamination of dielectric and metal films from low-k organosilicate glass (OSG) thin films in buffered pH solutions", Mater. Res. Soc. Symp. Proc. 795, 93-98 (2004). (Download) |
|
26.
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Y. Xiang, J. J. Vlassak, M. T. Perez-Prado, T. Y. Tsui, A. J. McKerrow, "The effects of passivation layer and film thickness on the mechanical behavior of freestanding electroplated Cu thin films with constant microstructure", Mater. Res. Soc. Symp. Proc. 795, 417-422 (2004). (Download) |
| 25. |
X. Wang, A. Lai, J. J. Vlassak, Y. Bellouard, "Microstructure evolution of on-substrate NiTi shape memory alloy thin films", Mater. Res. Soc. Symp. Proc. 795, 275-280 (2004). (Download) |
| 24. |
J. J. Vlassak, "A model for chemical-mechanical polishing of a material surface based on contact mechanics", J. Mech. Phys. Solids 52(4), 847-873 (2004). (Download) |
| 23. |
Y. Lin, J. J. Vlassak, T. Y. Tsui, A. J. McKerrow, "Environmental effects on subcritical delamination of dielectric and metal films from organosilicate glass (osg) thin films", Mater. Res. Soc. Symp. Proc. 766, E9.4 (2003). (Download) |
| 22. |
J. J. Vlassak, M. Ciavarella, J. R. Barber, X. Wang, "The indentation modulus of elastically anisotropic materials for indenters of arbitrary shape", J. Mech. Phys. Solids 51(9), 1701-1721 (2003). (Download) |
| 21. |
J. J. Vlassak, "Channel cracking in thin films on substrates of finite thickness", Int. J. Fract. 119(4), 299-312 (2003). (Download) |
| 20. |
M. T. Perez-Prado, J. J. Vlassak, "Texture evolution of Cu thin films during annealing", Mater. Sci. Forum 408(4), 1639-1644 (2002). |
| 19. |
M. T. Perez-Prado, J. J. Vlassak, "Microstructural evolution in electroplated Cu thin films", Scripta Materialia 47(12), 817-823 (2002). (Download) |
| 18. |
Y. Xiang, X. Chen, J. J. Vlassak, "The mechanical properties of electroplated Cu thin films measured by means of the bulge test technique", Mater. Res. Soc. Symp. Proc. 695, L4.9 (2002) (Download) |
| 17. |
M. Ciavarella, G. Demelio, M. Schino, J. J. Vlassak, "The general 3D-hertzian contact problem for anisotropic materials", in Experimental Techniques and Design in Composite Materials 5, Key Engineering Materials 221-222, 281-292 (2002). |
| 16. |
J. J. Vlassak, "A contact-mechanics based model for dishing and erosion in chemical-mechanical polishing", Mater. Res. Soc. Symp. Proc. 671, M4.6.1 (2001). (Download) |
| 15. |
X. Chen, J. J. Vlassak, "A numerical study on the measurements of thin film mechanical properties by means of nanoindentation", J. Mater. Res. 16(10), 2974-2982 (2001). (Download) |
| 14. |
T. Y. Tsui, J. J. Vlassak, W. D. Nix, "Indentation plastic displacement field: Part I. The case of soft films on hard substrates", J. Mater. Res. 14(6), 2204-2209 (1999). |
| 13. |
T. Y. Tsui, J. J. Vlassak, W. D. Nix, "Indentation plastic displacement field: Part II. The case of hard films on soft substrates" J. Mater. Res. 14(6), 2196-2203 (1999). |
| 12. |
K. W. McElhany, J. J. Vlassak, W. D. Nix, "Determination of indenter tip geometry and indentation contact area for depth-sensing indentation experiments", J. Mater. Res. 13(5), 1300-1306 (1998). |
| 11. |
J. J. Vlassak, T. Y. Tsui, W. D. Nix, "A new technique for visualizing the displacement field of indentations: the case of a soft film on a hard substrate", Mater. Res. Symp. Proc. 505, 71-76 (1998). |
| 10. |
S. Hsu, M. Dusa, J. J. Vlassak, C. Harker, M. Zimmerman, "Characterization and optimization of overlay targets for W CMP", Proc. SPIE, 360-370 (1998). |
| 9. |
J.J. Vlassak, M. D. Dror, W. D. Nix, "A simple technique for measuring the adhesion of brittle films to ductile substrates with application to diamond-coated titanium", J. Mater. Res. 12(7), 1900-1910 (1997). |
| 8. |
R. P. Vinci, J. J. Vlassak, "Mechanical behavior of thin films", Annu. Rev. Mater. Sci. 26, 431-462 (1996). |
| 7. |
V. M. Paviot, J. J. Vlassak, W. D. Nix, "Measuring the mechanical properties of thin metal films by means of bulge testing of micromachined windows", Mater. Res. Symp. Proc. 356, 579-584 (1995). |
| 6. |
J. J. Vlassak, W. D. Nix, "Measuring the elastic properties of anisotropic materials by means of indentation experiments", J. Mech. Phys. Solids 42(8), 1223-1245 (1994). (Download) |
| 5. |
J. J. Vlassak, W. D. Nix, "Indentation modulus of elastically anisotropic half spaces", Philos. Mag. A 67(5), 1045-1056 (1993). |
| 4. |
M. K. Small, J. J. Vlassak, S. F. Powel, B. J. Daniels, W. D. Nix, "Accuracy and reliability of bulge test experiments", Mater. Res. Symp. Proc. 308, 159-164 (1993). |
| 3. |
J. J. Vlassak, W. D. Nix, "A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films", J. Mater. Res. 7(12), 3242-3249 (1992). |
| 2. |
M. K. Small, J.J. Vlassak, W.D. Nix, "Re-examining the bulge test: methods for improving accuracy and reliability", Mater. Res. Symp. Proc. 239, 493-498 (1992). |
| 1. |
J. J. Vlassak, T. Nakayama, T. J. Konno, W. D. Nix, "Structure and mechanical properties of Fe/Zr multilayers", Mater. Res. Symp. Proc. 239, 493-498 (1992). |
The material in this website is based upon work supported by the National Science Foundation under Grants No. 0133559, 0215902, 9809363, CMS-0556169, DMR-0820484, DMR-0906892 and by the Air Force Office of Scientific Research under Grant No. FA9550-08-1-0374. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation or the Air Force Office of Scientific Research.
